Semi-analytical method for n–k inversion of ellipsometry data
800-805
10.1364/AO.58.000800
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85060943049&doi=10.1364%2fAO.58.000800&partnerID=40&md5=1fa53d0f396f3e7182af32073984ed7d
Scopus
58
4
2019
Applied Optics
M.Gilliot