Semi-analytical method for n–k inversion of ellipsometry data 800-805 10.1364/AO.58.000800 https://www.scopus.com/inward/record.uri?eid=2-s2.0-85060943049&doi=10.1364%2fAO.58.000800&partnerID=40&md5=1fa53d0f396f3e7182af32073984ed7d Scopus 58 4 2019 Applied Optics M.Gilliot